Difference between pages "I2CIO-8" and "I2CIO-8X"
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| − | [[File:tindie-mediums.png|link=https://www.tindie.com/products/land_boards/i2c- | + | [[File:tindie-mediums.png|link=https://www.tindie.com/products/land_boards/i2c-8-bit-io-mcp23008-i2cio-8x/]] |
| + | |||
| + | [[File:I2CIO-8X-6104-640px.jpg]] | ||
<video type="youtube">omUSJpGLv4A</video> | <video type="youtube">omUSJpGLv4A</video> | ||
| − | |||
| − | |||
== Features == | == Features == | ||
| Line 9: | Line 9: | ||
* 8 bits of Digital I/O | * 8 bits of Digital I/O | ||
* I2C interface | * I2C interface | ||
| − | * | + | * MCP23008P |
* Base address = 0x20 | * Base address = 0x20 | ||
* Address offset jumpers (0-7) | * Address offset jumpers (0-7) | ||
* Interrupt pin on I2C connectors | * Interrupt pin on I2C connectors | ||
| − | |||
* I2C Daisy-chain connectors | * I2C Daisy-chain connectors | ||
| − | * | + | * GVS (Ground/Voltage/Signal) pins for all 8-bits |
| − | |||
* 2.7V to 5.5V | * 2.7V to 5.5V | ||
* 49x49mm form factor | * 49x49mm form factor | ||
| Line 23: | Line 21: | ||
== Drivers/Example Code == | == Drivers/Example Code == | ||
| − | + | * [https://github.com/land-boards/lb-Arduino-Code/tree/master/libraries/LandBoards_I2CIO8X Github repo] - Driver code | |
| − | + | * [https://github.com/land-boards/lb-Arduino-Code/tree/master/LBCards/I2CIO8X Github repo] - Example code | |
| − | * [https://github.com/land-boards/lb-Arduino-Code/tree/master/libraries/ | ||
| − | * [https://github.com/land-boards/lb-Arduino-Code/tree/master/LBCards/ | ||
| − | |||
== Factory Acceptance Test == | == Factory Acceptance Test == | ||
| Line 42: | Line 37: | ||
* Uses [[Arduino_Based_Test_Station|ODAS Test Station V2]] | * Uses [[Arduino_Based_Test_Station|ODAS Test Station V2]] | ||
| + | * Ribbon cable sets | ||
| + | ** Loopback cable Connector | ||
| + | ** [[LED-32]] cable | ||
* Unit Under Test (UUT) | * Unit Under Test (UUT) | ||
* Attach Host Computer USB to the Arduino NANO on the Test Station | * Attach Host Computer USB to the Arduino NANO on the Test Station | ||
| Line 59: | Line 57: | ||
</pre> | </pre> | ||
| − | * Select | + | * Select 2 |
<pre> | <pre> | ||
| − | Init I2CIO- | + | Init I2CIO-8X card |
C=Card Tests, D=Direct, E=EEPROM, I=access Internal DIGIO32 | C=Card Tests, D=Direct, E=EEPROM, I=access Internal DIGIO32 | ||
</pre> | </pre> | ||
| − | === Running Card Test === | + | === Running Loopback Card Test === |
| + | * Use loopback cable | ||
* Select Card Tests = "C" | * Select Card Tests = "C" | ||
* Select Run Tests = "T" | * Select Run Tests = "T" | ||
| − | |||
| − | |||
| − | |||
* Observe test results | * Observe test results | ||
<pre> | <pre> | ||
| − | + | L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Test, X=eXit sub-menu | |
| − | L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l | + | Testing UUT = I2CIO-8X |
| − | Testing UUT = I2CIO- | ||
| − | |||
| − | |||
| − | |||
| − | |||
Test PASS = 1, FAIL = 0 | Test PASS = 1, FAIL = 0 | ||
</pre> | </pre> | ||
| Line 107: | Line 98: | ||
=== Running Blink LED Test === | === Running Blink LED Test === | ||
| + | * Attach [[LED-32]] cable | ||
* Select Card Tests = "C" | * Select Card Tests = "C" | ||
* Select Run Tests = "B" | * Select Run Tests = "B" | ||
| − | * Observe LEDs scanning on | + | * Observe LEDs scanning on [[LED-32]] |
<pre> | <pre> | ||
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Test, X=eXit sub-menu | L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Test, X=eXit sub-menu | ||
Bounce a bit across outputs | Bounce a bit across outputs | ||
| − | Bouncing LEDs | + | Bouncing LEDs I2CIO8X - any key to stop |
</pre> | </pre> | ||
* Hit ENTER to display the menu | * Hit ENTER to display the menu | ||
Revision as of 20:25, 21 March 2022
Contents
Features
- 8 bits of Digital I/O
- I2C interface
- MCP23008P
- Base address = 0x20
- Address offset jumpers (0-7)
- Interrupt pin on I2C connectors
- I2C Daisy-chain connectors
- GVS (Ground/Voltage/Signal) pins for all 8-bits
- 2.7V to 5.5V
- 49x49mm form factor
- (4) #4-40 mounting holes
Drivers/Example Code
- Github repo - Driver code
- Github repo - Example code
Factory Acceptance Test
Test Station Theory of Operations
- Test Station controls the I2C interface on the UUT
- Three tests
- Internal Test
- External Loopback Test
- Bounce an LED Test
Test Station Set-up
- Uses ODAS Test Station V2
- Ribbon cable sets
- Loopback cable Connector
- LED-32 cable
- Unit Under Test (UUT)
- Attach Host Computer USB to the Arduino NANO on the Test Station
- Run puTTY on the Host Computer
- 9600 baud
Card Selection
- puTTY will display the menu
Checking if EEPROM is present on UUT...EEPROM is not present on UUT Count of I2C devices in range 0x20-0x27 on UUT = 1 Detected MCP23008 Select the board type (Other) 1 - I2CIO8 board 2 - I2CIO8X board Select board >
- Select 2
Init I2CIO-8X card C=Card Tests, D=Direct, E=EEPROM, I=access Internal DIGIO32
Running Loopback Card Test
- Use loopback cable
- Select Card Tests = "C"
- Select Run Tests = "T"
- Observe test results
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Test, X=eXit sub-menu Testing UUT = I2CIO-8X Test PASS = 1, FAIL = 0
- Hit ENTER to display menu
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Test, X=eXit sub-menu
Running Internal Tests
- Remove loopback cable
- Select Card Tests = "C"
- Select Run Tests = "I"
- Observe test results
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Tests, X=eXit sub-menu UUT Internal card tests Test PASS = 2, FAIL = 0
- Hit ENTER to display menu
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Test, X=eXit sub-menu
Running Blink LED Test
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Test, X=eXit sub-menu Bounce a bit across outputs Bouncing LEDs I2CIO8X - any key to stop
- Hit ENTER to display the menu
Finished bouncing LEDs
