Difference between revisions of "I2CIO-8X"

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* Select Run Tests = "I"
 
* Select Run Tests = "I"
 
* Observe test results
 
* Observe test results
 +
<pre>
 +
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Tests, X=eXit sub-menu
 +
UUT Internal card tests
 +
Test PASS = 1, FAIL = 0
 +
</pre>
 +
* Hit ENTER to display menu
 +
<pre>
 +
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Test, X=eXit sub-menu
 +
</pre>
  
 
=== Running Blink LED Test ===
 
=== Running Blink LED Test ===

Revision as of 20:10, 21 March 2022

Tindie-mediums.png

I2CIO-8X-6104-640px.jpg

Features

  • 8 bits of Digital I/O
  • I2C interface
  • MCP23008P
  • Base address = 0x20
  • Address offset jumpers (0-7)
  • Interrupt pin on I2C connectors
  • I2C Daisy-chain connectors
  • GVS (Ground/Voltage/Signal) pins for all 8-bits
  • 2.7V to 5.5V
  • 49x49mm form factor
  • (4) #4-40 mounting holes

Drivers/Example Code

Factory Acceptance Test

Test Station Theory of Operations

  • Test Station controls the I2C interface on the UUT
  • Three tests
    • Internal Test
    • External Loopback Test
    • Bounce an LED Test

Test Station Set-up

  • Uses ODAS Test Station V2
  • Ribbon cable sets
    • Loopback cable Connector
    • LED-32 cable
  • Unit Under Test (UUT)
  • Attach Host Computer USB to the Arduino NANO on the Test Station
  • Run puTTY on the Host Computer
    • 9600 baud

Card Selection

Checking if EEPROM is present on UUT...EEPROM is not present on UUT
Count of I2C devices in range 0x20-0x27 on UUT = 1
Detected MCP23008
Select the board type (Other)
1 - I2CIO8 board
2 - I2CIO8X board
Select board >
  • Select 2
Init I2CIO-8X card
C=Card Tests, D=Direct, E=EEPROM, I=access Internal DIGIO32

Running Loopback Card Test

  • Use loopback cable
  • Select Card Tests = "C"
  • Select Run Tests = "T"
  • Observe test results

Running Internal Tests

  • Remove loopback cable
  • Select Card Tests = "C"
  • Select Run Tests = "I"
  • Observe test results
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Tests, X=eXit sub-menu
UUT Internal card tests
Test PASS = 1, FAIL = 0
  • Hit ENTER to display menu
L=Loop/S=Single, T=Test, B=Bounce LEDs, I=UUT Int'l Test, X=eXit sub-menu

Running Blink LED Test

  • Attach LED-32 cable
  • Select Card Tests = "C"
  • Select Run Tests = "B"
  • Observe LEDs scanning in LED-32

Reference

Assembly Sheet